Atec Teseq-NSG_5071 Manuel d'utilisateur télécharger pdf

Advanced Test Solutions for EMC

The NSG 5071 is designed exactly in accordance with EMC-CS-2009.1 for test CI 220 pulses A1, A2-1, A2-2,

C1, C2 and RI 130 using an inductive/relay transient generator test circuit. The NSG 5071 also features

the CI 260 Waveform F in this test circuit which uses the same type of relay. This test circuit is deﬁ ned

in annex F for the A, C pulses and RI 130 and ﬁ gure 19-10 for CI 260 Waveform F.

The basic philosophy of this test circuit is better reproducibility of actual switching transients. The repro-

ducibility of this test circuit comes not from the output characteristics as in traditional conducted auto-

motive immunity tests, but from a ﬁ xed design of the generator using several pre-deﬁ ned components.

Many of these components are deﬁ ned in the standard as “critical” with no substitutions allowed. These

components are used as required in the standard.

The test circuit is based primarily around a Potter and Brumﬁ eld relay and two inductors from Osborne

Transformer. The relay is used in three ways: to switch the voltage off to inductors thus causing large

inductive kickback transients, to self-chatter, and in the case of Waveform F, to act as a randomized

dropout test.

The NSG 5071 is a convenient way of using the required components in the different required conﬁ gura-

tions in the standard to provide a single output to the EUT and maximize ease-of-use.

Designed in accordance to Ford

standard EMC-CS-2009

Transients disturbances CI 220 A

and C pulses

CI 260 waveform F

User replaceable relays

Timer to track relay usage

Up to 30 A DUT current

INDUCTIVE SWITCH TRANSIENT TEST CIRCUIT

NSG 5071

Critical components used: Potter and Brumﬁ eld KUP-14A15-12

5 μH Osborn Transformer PN 8745

100 mH Osborn Transformer PN 32416

DC current (I

max

): 10 A with supplied relay

Up to 30 A with user-installed relay

DC voltage (U

max

): 15 V

Technical specifications

(as definied by the standard)

1 2

NSG 5071 1

Résumé du contenu

Page 1 - NSG 5071

Advanced Test Solutions for EMCThe NSG 5071 is designed exactly in accordance with EMC-CS-2009.1 for test CI 220 pulses A1, A2-1, A2-2, C1, C2 and RI

Page 2

Advanced Test Solutions for EMCINDUCTIVE SWITCH TRANSIENT TEST CIRCUITNSG 5071Example pulses:© February 2011 Teseq® Specifications subject to change w

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Atec Teseq-NSG_5071 Manuel d'utilisateur

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